ROBUST: Design of Robust Nanoelectronic Systems

ROBUST researches new methods and procedures for designing robust nanoelectronic systems. For the first time ever, the project defines quantitative measures of robustness. These metrics are determined by abstracting models of robustness and by applying new analysis methods suitable for the system level. Robustness metrics are employed for guiding and assessing static and dynamic optimization of robustness. The results of ROBUST are methods and prototype tools that enable early consideration of robustness in the context of a top-down system design flow. The methods and prototypes are applied to a demonstrator design for evaluation purposes. They are made available to industrial research partners as a basis for integrating robustness into their design processes.

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